Open Access Research Article CC BY 4.0 Published 5 January 2026

Multi-Task Learning for Anomaly Detection and Remaining Useful Life Prediction in Semiconductor Manufacturing Systems

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  1. 1 University of California-Berkeley

* Corresponding author: Min Yin · gmiayinc@gmail.com

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Copyright © 2026 The Author(s). Published by Southern United Academy of Sciences.
This work is licensed under a Creative Commons Attribution 4.0 International License , which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.