JIEAS OPEN ACCESS
Journal of Industrial Engineering and Applied Science
ISSN:3005-608X (print) | ISSN:3005-6071 (online) | Publication Frequency: Bimonthly
Current Issue
All articles published in this issue have undergone a thorough peer review process, and stringent checks for repetition rates have been implemented to ensure the integrity of the content.
Total number of articles in this issue: 0
Total number of pages in this issue: 46
For inquiries regarding the content of specific articles, please feel free to contact the respective authors via their provided email addresses. For questions related to the journal itself, please reach out directly to SUAS Press.
Year
2025
Volume
3
Number
6
Status
Archived
Published
2025 December 3
Articles
Generative Diffusion Models for Option Pricing: A Novel Framework for Modeling Volatility Dynamics in U.S. Financial Markets
Yinlei Chen.This study proposes a generative diffusion modeling framework to estimate option prices and volatility surfaces in U.S. financial markets. Unlike conventional stochastic volatility models, the diffusi...
Few-Shot and Domain Adaptation Modeling for Evaluating Growth Strategies in Long-Tail Small and Medium-sized Enterprises
Wenwen Liu.To enhance the execution of growth strategies for SMEs under data sparsity and domain shift, this study combines domain adaptation with few-shot learning to identify growth bottlenecks and generate ac...
Research on an Automated Data Insight Generation Method Based on Large Language Models
Jingtao Hong;Huichen Ma.This study aims to explore automated data insight generation methods based on large language models (LLMs), and systematically analyzes the application potential and challenges of LLMs in the field of...
Predictive Maintenance of Semiconductor Equipment Using Stacking Classifiers and Explainable AI: A Synthetic Data Approach for Fault Detection and Severity Classification
Min Yin.In the semiconductor manufacturing industry, predictive maintenance is a key strategy for reducing equipment downtime. This paper proposes a machine learning-based predictive model for semiconductor e...
Data Quality Control in Semiconductor Manufacturing through Automated ETL Processes and Class Imbalance Handling Techniques
Min Yin.In semiconductor manufacturing, ensuring data quality is crucial for maintaining high production efficiency and product consistency. However, missing values, noise, and class imbalance in sensor data ...
Copyright © 2025 The Author(s). Published by Southern United Academy of Sciences.This work is licensed under a Creative Commons Attribution 4.0 International License , which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.
Persistent Identifiers
Abstracting and Indexing
Quality Assurance
Archiving Services
